ICP-MS Sampler Cones & Care Packages

The ICP-MS sampler cone forms part of the interface region, sampling ions from the atmospheric plasma and transitioning them into the high vacuum MS for detection. High-quality sample cones are key to the sensitivity and stability of an ICP-MS. Agilent sampler cones, with a nickel or platinum tip, use high-purity materials to minimize background and ensure stability within the plasma. They are manufactured to stringent specifications and rigorously tested to ensure excellent batch to batch reproducibility. The orifice dimensions and tip geometry are optimized and tightly controlled as they are key parameters defining an ICP-MS’s sensitivity, background level, oxide and doubly charged ratio and matrix tolerance which are all critical parameters to achieve successful measurements of elemental content in a sample.For demanding applications such as semiconductors and advanced materials, the Pt-tip cones allow to achieve the lowest backgrounds.